Scanning probe microscopy cantilevers improvement for advanced research and manipulation at nano scale.
نویسندگان
چکیده
منابع مشابه
Radio-Frequency Cantilevers for Scanning Probe Microscopy
We are fabricating radio-frequency silicon nitride cantilevers for the use in scanning probe microscopy. These cantilevers will be used to study dielectric fluctuations above thin polymers films and charging behavior in organic field-effect transistors. Further, we have fabricated doublyclamped cantilevers of similar dimension and constituency and employed a magnetomotive scheme to measure thei...
متن کاملBismuth Micro and Nano Hall Sensors on Photo-plastic Cantilevers for Scanning Hall Probe Microscopy
Conventional Hall devices are widely employed to measure magnetic fields produced by millimetre sized (or larger) current-caring conductors or permanent magnets with a standard active area of about (100 μm). Micro-Hall sensors have recently emerged as a powerful and sensitive tool for the investigation of local magnetic field properties of the micro and nanostructures. The conventional Hall eff...
متن کاملScanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
متن کاملScanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
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ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2020
ISSN: 1742-6588,1742-6596
DOI: 10.1088/1742-6596/1461/1/012190